The spectroscopy of core electrons, e.g. XPS and AES, offers exciting capabilities for a whole new area of electrical studies. In a recent method called chemically resolved electrical measurements (CREM),1-3 energy filtered electrons are exploited as fine and flexible electrodes that probe electrical properties in a non-contact mode and, more importantly, at selected surface addresses. CREM can resolve inner, sub-surface regions in heterostructures and, hence, propose a superior future tool for the characterization of semiconducting devices. It has been successfully applied for advanced work-function measurements, rapid non-destructive depth profiling, and detailed photovoltaic measurements in systems consisting of several photoactive components. Intriguing results have been obtained in CREM analyses of self-assembled monolayers, where sub-molecular electrical information could be extracted at nearly atomic resolution.4 In this review, potential applications and questions raised by the CREM observations will be discussed.
Chemically Resolved Electrical Measure-ments (CREM): Approaching Atomic Scale Electrical Properties
KIT - Campus South - Wolfgang-Gaede-Str. 1
Prof. Dr. Hagai Cohen