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Chemically Resolved Electrical Measure-ments (CREM): Approaching Atomic Scale Electrical Properties

Chemically Resolved Electrical Measure-ments (CREM): Approaching Atomic Scale Electrical Properties
Venue:

KIT - Campus South - Wolfgang-Gaede-Str. 1
Seminar Room 06.01, Bldg. 30.23 (Physikhochhaus)

Date: 07.07.2010
Speaker:

Prof. Dr. Hagai Cohen
Weizmann Institute of Sience, Israel

Time:

 16:30

Abstract
The spectroscopy of core electrons, e.g. XPS and AES, offers exciting capabilities for a whole new area of electrical studies. In a recent method called chemically resolved electrical measurements (CREM),1-3 energy filtered electrons are exploited as fine and flexible electrodes that probe electrical properties in a non-contact mode and, more importantly, at selected surface addresses. CREM can resolve inner, sub-surface regions in heterostructures and, hence, propose a superior future tool for the characterization of semiconducting devices. It has been successfully applied for advanced work-function measurements, rapid non-destructive depth profiling, and detailed photovoltaic measurements in systems consisting of several photoactive components. Intriguing results have been obtained in CREM analyses of self-assembled monolayers, where sub-molecular electrical information could be extracted at nearly atomic resolution.4 In this review, potential applications and questions raised by the CREM observations will be discussed.